Phase Noise & Frequency Stability Analyzers
Solutions
Discover Noise XT®
NOISE XT is a specialised manufacturer of high‑performance instruments dedicated to phase‑noise and frequency‑stability measurements. Now part of the Spherea Group, NOISE XT brings over 25 years of expertise in designing high‑performance phase‑noise analysers, used in the most demanding applications, including radar systems, telecommunications, and high‑speed digital systems, where characterising the phase noise or frequency stability of high‑performance oscillators is crucial.
The NOISE XT product range provides precise, efficient, and easy‑to‑use tools for absolute and additive phase‑noise measurements, supporting both continuous‑wave (CW) and pulsed signals.
Why choose NOISE XT instruments?
Ultra-low noise floor
Using the principle of cross‑correlation (also known as inter‑correlation or cross‑correlation), Noise XT instruments achieve a state‑of‑the‑art noise floor.
Measurement flexibility
Support for absolute and additive phase‑noise measurements across a wide frequency range, from MHz to several tens of GHz.
Long-term upgradeability
Our instruments are based on a modular architecture, allowing hardware or software options to be added so they can adapt to the evolution of your needs.
Common features across the product range
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Absolute and additive phase noise measurement
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CW and pulsed signal support
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Integrated frequency stability analysis
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Ultra-low intrinsic noise floor
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Designed for metrology-grade environments
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Features per product
Noise XT DNA Family
Digital phase‑noise analysers, phase‑lock‑free, ultra‑low noise, user‑friendly and easy to operate, designed for demanding metrology, laboratory, and industrial applications.RF input frequency: 2 MHz to 100 MHz (DNA 100M)
or 2 MHz to 400 MHz (DNA 400M)
Frequency offset: 1 mHz to 1 MHz (usable up to 10 MHz)
Phase‑noise floor: < –190 dBc/Hz
Immune to cross‑correlation leakage issuesNoise XT NXA 6
Flexible and user‑friendly phase‑noise analyser for laboratory and industrial environments.Input frequency: 2 MHz to 6 GHz
Frequency offset: 0.001 Hz to 40 MHz
Measurement accuracy from 1 Hz to 1 MHz: ±2 dB
Measurement accuracy from 1 MHz to 40 MHz: ±3 dB
Cross‑correlationNoise XT DCNTS
State-of-the-art analyser delivering the lowest noise floor on the market, without phase locking.Lowest noise level in the industry: –195 dBc/Hz
Additive noise‑floor performance
Lowest spurious tones on the market
Input frequency: 2 MHz to 1.8 / 26.5 / 40 / 50 GHz
Frequency offset: 0.001 Hz to 40 MHz
Measurement accuracy from 1 Hz to 1 MHz: ±2 dB
Measurement accuracy from 1 MHz to 40 MHz: ±3 dB
Cross‑correlationNoise XT PN9000
High-performance solution for advanced phase noise and frequency stability measurements.RF Input Frequency : 2 MHz to 1.8/26.5/40/50 GHz
Offset analysis : 0.001 Hz to 40 MHz
Accuracy 1 Hz to 1 MHz offset : +/- 2 dB
Accuracy to 40 MHz offset : +/- 3 dBNoise XT PN9002
Solution specially designed for phase‑noise measurements in radar pulses.Frequency offset: 400 MHz to 18 GHz
Input‑frequency measurement range: 2 to 18 GHz and, optionally, 0.4 to 18 GHz
Single‑ or dual‑channel architecture (simultaneous phase and amplitude measurements)
Designed for pulsed microwave devices
